发明名称 Monolayer Stress Microscopy
摘要 Disclosed are systems, apparatus, devices and methods, including a method that includes determining traction forces exerted by a cellular monolayer on a substrate on which the monolayer is placed, and determining internal forces within and between cells of the monolayer based on the determined traction forces. In some embodiments, determining the internal forces of the cellular monolayer may include determining internal stresses within the cellular monolayer that act to balance the determined traction forces over at least part of the cellular monolayer. In some embodiments, determining of the internal stresses may also include setting boundary conditions at a boundary determined based on an optical field of view of an observed section of the monolayer.
申请公布号 US2014212909(A1) 申请公布日期 2014.07.31
申请号 US201214110936 申请日期 2012.04.13
申请人 Tambe Dhananjay T.;Fredberg Jeffrey J.;Butler James;Trepat Xavier 发明人 Tambe Dhananjay T.;Fredberg Jeffrey J.;Butler James;Trepat Xavier
分类号 G01N33/483;G06T7/20;G06K9/00 主分类号 G01N33/483
代理机构 代理人
主权项 1. A method comprising: determining traction forces exerted by a cellular monolayer on a substrate on which the monolayer is placed; and determining internal forces within and between cells of the monolayer based on the determined traction forces.
地址 Brighton MA US