发明名称 SAMPLE INSPECTION AUTOMATION SYSTEM
摘要 There is provided a sample inspection automation system which uses a single holder as its carrier, which can supply empty holders to a distant processing unit on an extended circling path without delay, and which permits continuous operation in case of a failure through detachment of a failed part for example. The system combining a plurality of processing units has an empty holder circling path with a mechanism to circle empty holders across all processing units within the system in unicursal fashion; stoppers for retaining empty holders on the circling path; and a mechanism for controlling the stoppers on the circling path given an empty holder request from a processing unit. The empty holder circling path is made of a plurality of loops each equipped with the stopper. The sample inspection automation system thus configured supplies empty holders efficiently and simplifies system operation through fallback operation.
申请公布号 US2014208872(A1) 申请公布日期 2014.07.31
申请号 US201214238615 申请日期 2012.09.06
申请人 Yasuzawa Kenichi;Kamoshida Koji;Akutsu Masashi 发明人 Yasuzawa Kenichi;Kamoshida Koji;Akutsu Masashi
分类号 G01N35/04 主分类号 G01N35/04
代理机构 代理人
主权项 1. A sample inspection automation system comprising: a plurality of processing units; a main transport path which transports holders loaded with samples to be processed in said plurality of processing units; an empty holder transport path which transports sample-free empty holders, and a supply means which supplies the holders on said empty holder transport path to said processing units or to said main transport path; wherein said empty holder transport path is formed with a plurality of loop transport paths disposed in a looped manner.
地址 Tokyo JP