发明名称 |
SAMPLE INSPECTION AUTOMATION SYSTEM |
摘要 |
There is provided a sample inspection automation system which uses a single holder as its carrier, which can supply empty holders to a distant processing unit on an extended circling path without delay, and which permits continuous operation in case of a failure through detachment of a failed part for example. The system combining a plurality of processing units has an empty holder circling path with a mechanism to circle empty holders across all processing units within the system in unicursal fashion; stoppers for retaining empty holders on the circling path; and a mechanism for controlling the stoppers on the circling path given an empty holder request from a processing unit. The empty holder circling path is made of a plurality of loops each equipped with the stopper. The sample inspection automation system thus configured supplies empty holders efficiently and simplifies system operation through fallback operation. |
申请公布号 |
US2014208872(A1) |
申请公布日期 |
2014.07.31 |
申请号 |
US201214238615 |
申请日期 |
2012.09.06 |
申请人 |
Yasuzawa Kenichi;Kamoshida Koji;Akutsu Masashi |
发明人 |
Yasuzawa Kenichi;Kamoshida Koji;Akutsu Masashi |
分类号 |
G01N35/04 |
主分类号 |
G01N35/04 |
代理机构 |
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代理人 |
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主权项 |
1. A sample inspection automation system comprising:
a plurality of processing units; a main transport path which transports holders loaded with samples to be processed in said plurality of processing units; an empty holder transport path which transports sample-free empty holders, and a supply means which supplies the holders on said empty holder transport path to said processing units or to said main transport path; wherein said empty holder transport path is formed with a plurality of loop transport paths disposed in a looped manner. |
地址 |
Tokyo JP |