发明名称 METHOD FOR FABRICATING THE SEMICONDUCTOR DEVICE
摘要 <p>Provided is a method for fabricating a semiconductor device. The method for fabricating a semiconductor device includes exposing an active region and a device isolation region by patterning an etch prevention layer which is formed on a substrate which includes the active region and the device isolation region; nitrifying the upper surface of the exposed device isolation region by performing a plasma nitridation process; forming a first recess in the exposed active region; and forming a stress generation layer in the first recess.</p>
申请公布号 KR20140094722(A) 申请公布日期 2014.07.31
申请号 KR20130006603 申请日期 2013.01.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHA, JI HOON;BAEK, JAE JIK;YOON, BO UN;YOUN, YOUNG SANG;HAN, JEONG NAM
分类号 H01L21/762;H01L21/336;H01L29/78 主分类号 H01L21/762
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