DEFECT DETECTING SYSTEM AND METHOD

摘要

Disclosed is a system to inspect a defect. The system to detect a defect includes: a first sensor positioned on top of one side of an object being inspected; and a second sensor positioned on top of one side of the object being inspected, while being separated from the first sensor. Here, the system to inspect a defect uses the results detected from the sensors to detect the occurrence and types of defects of the object being inspected.