| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a technique which enables a simple quality determination of signal wiring affected by a chip or a crack in a substrate without increasing manufacturing processes.SOLUTION: A display apparatus comprises: a coordinate input device including a transparent substrate having first signal wiring which is arranged in a region outside of a detection region for a contact position, the transparent substrate having one end connected to a detection electrode and the other end in which a first electrode terminal is formed, and a flexible wiring substrate having flexibility of being connected to the first electrode terminal; and a display panel for displaying an image according to an image signal from an external system. The coordinate input device comprises second signal wiring which is arranged in a more marginal part side of the transparent substrate than the first signal wiring, and which surrounds a formation region of the first signal wiring including the detection region, and both ends of which are open circuit, and on the respective open ends is formed an electrode terminal for inspection. The second signal wiring is a display apparatus formed with a conductive thin film provided along the marginal part of the transparent substrate.</p> |
