发明名称 AUTOMATIC PROGRAMMING OF SOLDER PASTE INSPECTION SYSTEM
摘要 <p>A system for measuring solder paste stencil aperture positions and sizes is provided. The system includes at least one camera (21) configured to acquire images of the stencil (2) and an alignment target (1). A motion system (31) generates relative motion between the at least one camera (21) and the stencil (2). A controller (3) is coupled to and controls the motion system. The controller (3, 8) is configured to analyze the images to generate aperture information relative to the stencil (2). The aperture information is provided to automatically program a solder paste inspection system. Other features and benefits that characterize embodiments of the present invention will be apparent upon reading the following detailed description and review of the associated drawings.</p>
申请公布号 WO2014116807(A1) 申请公布日期 2014.07.31
申请号 WO2014US12710 申请日期 2014.01.23
申请人 CYBEROPTICS CORPORATION 发明人 BUTLER, DOUGLAS, G.;HAUGAN, CARL, E.
分类号 G01B11/00;G06T7/00;H05K13/08 主分类号 G01B11/00
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