发明名称 SELF ALIGNED DUAL PATTERNING TECHNIQUE ENHANCEMENT WITH MAGNETIC SHIELDING
摘要 <p>Embodiments of the present disclosure generally provide apparatus and method for improving processing uniformity by reducing external magnetic noises. One embodiment of the present disclosure provides an apparatus for processing semiconductor substrates. The apparatus includes a chamber body defining a vacuum volume for processing one or more substrate therein, and a shield assembly for shielding magnetic flux from the chamber body disposed outside the chamber body, wherein the shield assembly comprises a bottom plate disposed between the chamber body and the ground to shield magnetic flux from the earth.</p>
申请公布号 WO2014116399(A1) 申请公布日期 2014.07.31
申请号 WO2014US10071 申请日期 2014.01.02
申请人 APPLIED MATERIALS, INC. 发明人 KIM, HUN SANG;KIM, SANG WOOK;KHAN, ANISUL H.
分类号 H01L21/02 主分类号 H01L21/02
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