发明名称 PROBE MODULE
摘要 <p>A probe module includes: a substrate including a through-hole and at least four probe-needle columns arranged on the substrate. The probe-needle columns are arranged along a first direction from a first side surface to a second side surface. Each of the probe-needle columns has at least two needles arranged in a second direction. Each of the needles includes a contact segment and an arm segment forming an included angle with the contact segment. An end unit of the arm segment is connected to the substrate, and the other end extends to the through-hole to be in contact with the contact segment. The contact segments of needles of the probe-needle columns have equivalent lengths. The included angles of the needles of the probe-needle columns in the first direction gradually increase from the first side surface and the second side surface.</p>
申请公布号 KR20140094465(A) 申请公布日期 2014.07.30
申请号 KR20140007146 申请日期 2014.01.21
申请人 MPI CORPORATION 发明人 CHANG CHIA TAI
分类号 G01R1/073 主分类号 G01R1/073
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