发明名称 High Electron Mobility Transistor (HEMT)
摘要 A semiconductor device includes: a first buffer layer formed on a substrate; a second buffer layer formed on a portion of the first buffer layer; a third buffer layer formed on the first buffer layer and the second buffer layer; a first semiconductor layer formed on the third buffer layer; a second semiconductor layer formed on the first semiconductor layer; and a gate electrode, a source electrode, and a drain electrode that are formed on the second semiconductor layer, wherein the second buffer layer is composed of a material with higher resistivity than the first semiconductor layer; and the second buffer layer is formed in a region immediately below and between the gate electrode and the drain electrode.
申请公布号 EP2760051(A2) 申请公布日期 2014.07.30
申请号 EP20130192432 申请日期 2013.11.12
申请人 FUJITSU LIMITED 发明人 KAMADA, YOUICHI
分类号 H01L29/778;H01L21/338;H01L29/423 主分类号 H01L29/778
代理机构 代理人
主权项
地址