发明名称 |
Surface acoustic wave resonator, surface acoustic wave oscillator, and electronic apparatus |
摘要 |
A surface acoustic wave resonator includes a quartz substrate with preselected Euler angles and an IDT on the quartz substrate. The IDT includes electrode fingers and excites a stop band upper end mode surface acoustic wave. Inter-electrode finger grooves are provided between the electrode fingers. Assuming a surface acoustic wave wavelength is λ, an electrode finger film thickness is H, an inter-electrode finger groove depth is G, a line occupation rate of convex portions of the substrate between the inter-electrode finger grooves is ηg, and a line occupation rate of the electrode fingers on the convex portions is ηe, 0.0407λ≦G+H; and ηg>ηe. |
申请公布号 |
US8791621(B2) |
申请公布日期 |
2014.07.29 |
申请号 |
US201314066959 |
申请日期 |
2013.10.30 |
申请人 |
Seiko Epson Corporation |
发明人 |
Owaki Takuya;Yamanaka Kunihito;Iizawa Keigo;Hano Kenichi |
分类号 |
H01L41/047 |
主分类号 |
H01L41/047 |
代理机构 |
Harness, Dickey & Pierce, P.L.C. |
代理人 |
Harness, Dickey & Pierce, P.L.C. |
主权项 |
1. A surface acoustic wave resonator comprising:
a quartz crystal substrate with Euler angles (−1.5°≦φ≦1.5°, 117°≦θ≦142°, and 42.79°≦|Ψ|≦49.57°); an IDT that is provided on the quartz crystal substrate, that includes a plurality of electrode fingers, and that excites a stop band upper end mode surface acoustic wave; and inter-electrode finger grooves that are provided in the quartz crystal substrate between the electrode fingers in a plan view, wherein when a wavelength of the surface acoustic wave is λ, a first film thickness of the electrode finger is H, and a first depth of the inter-electrode finger groove is G, and when a line occupation rate of convex portions of the quartz crystal substrate disposed between the inter-electrode finger grooves is ηg, and a line occupation rate of the electrode fingers disposed on the convex portions is ηe, the following relationships are satisfied:
0.0407λ≦G+H; andηg>ηe. |
地址 |
JP |