发明名称 |
Concentric coplanar capacitive sensor system with quantitative model |
摘要 |
A concentric coplanar capacitive sensor includes a charged central disc forming a first electrode, an outer annular ring coplanar with and outer to the charged central disc, the outer annular ring forming a second electrode, and a gap between the charged central disc and the outer annular ring. The first electrode and the second electrode may be attached to an insulative film. A method provides for determining transcapacitance between the first electrode and the second electrode and using the transcapacitance in a model that accounts for a dielectric test piece to determine inversely the properties of the dielectric test piece. |
申请公布号 |
US8791707(B2) |
申请公布日期 |
2014.07.29 |
申请号 |
US201113185156 |
申请日期 |
2011.07.18 |
申请人 |
Iowa State University Research Foundation, Inc. |
发明人 |
Bowler Nicola;Chen Tianming |
分类号 |
G01N27/22;G01R27/26 |
主分类号 |
G01N27/22 |
代理机构 |
McKee, Voorhees & Sease |
代理人 |
McKee, Voorhees & Sease |
主权项 |
1. A concentric coplanar capacitive sensor system, comprising:
a concentric coplanar capacitive sensor comprising (a) a charged central disc forming a first electrode, (b) an outer annular ring coplanar with and outer to the charged central disc, the outer annular ring forming a second electrode, (c) a gap between the charged central disc and the outer annular ring, and (d) the first electrode and the second electrode attached to an insulative film; a capacitance measuring circuit electrically connected to the concentric coplanar capacitive sensor for measuring transcapacitance between the first electrode and the second electrode for use in evaluating a dielectric test piece; a processor operatively connected to the first electrode, the processor configured to use the transcapacitance as an input to a quantitative model of the dielectric test piece to determine inversely properties of the dielectric test piece; wherein the quantitative model provides a quantitative relationship between a transcapacitance measured with the concentric coplanar capacitive sensor and permittivity and thickness of each of a plurality of layers in the dielectric test piece. |
地址 |
Ames IA US |