发明名称 Concentric coplanar capacitive sensor system with quantitative model
摘要 A concentric coplanar capacitive sensor includes a charged central disc forming a first electrode, an outer annular ring coplanar with and outer to the charged central disc, the outer annular ring forming a second electrode, and a gap between the charged central disc and the outer annular ring. The first electrode and the second electrode may be attached to an insulative film. A method provides for determining transcapacitance between the first electrode and the second electrode and using the transcapacitance in a model that accounts for a dielectric test piece to determine inversely the properties of the dielectric test piece.
申请公布号 US8791707(B2) 申请公布日期 2014.07.29
申请号 US201113185156 申请日期 2011.07.18
申请人 Iowa State University Research Foundation, Inc. 发明人 Bowler Nicola;Chen Tianming
分类号 G01N27/22;G01R27/26 主分类号 G01N27/22
代理机构 McKee, Voorhees & Sease 代理人 McKee, Voorhees & Sease
主权项 1. A concentric coplanar capacitive sensor system, comprising: a concentric coplanar capacitive sensor comprising (a) a charged central disc forming a first electrode, (b) an outer annular ring coplanar with and outer to the charged central disc, the outer annular ring forming a second electrode, (c) a gap between the charged central disc and the outer annular ring, and (d) the first electrode and the second electrode attached to an insulative film; a capacitance measuring circuit electrically connected to the concentric coplanar capacitive sensor for measuring transcapacitance between the first electrode and the second electrode for use in evaluating a dielectric test piece; a processor operatively connected to the first electrode, the processor configured to use the transcapacitance as an input to a quantitative model of the dielectric test piece to determine inversely properties of the dielectric test piece; wherein the quantitative model provides a quantitative relationship between a transcapacitance measured with the concentric coplanar capacitive sensor and permittivity and thickness of each of a plurality of layers in the dielectric test piece.
地址 Ames IA US