| 发明名称 |
Method and apparatus for bypassing silicon bugs |
| 摘要 |
The present invention provides a method and apparatus for bypassing silicon bugs. One exemplary embodiment of the method includes using a logic element formed on a substrate to detect a predefined trigger condition indicating onset of a functional bug during operation of a semiconductor device formed on the substrate. The method also includes modifying operation of the semiconductor device to avoid onset of the functional bug by taking a predefined action associated with the predefined trigger condition. |
| 申请公布号 |
US8791713(B2) |
申请公布日期 |
2014.07.29 |
| 申请号 |
US201012817791 |
申请日期 |
2010.06.17 |
| 申请人 |
Advanced Micro Devices, Inc. |
发明人 |
Walker William L. |
| 分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method, comprising:
detecting, using a logic element formed on a substrate, a predefined trigger condition indicating onset of a functional bug during operation of a semiconductor device formed on the substrate; and modifying, using the logic element, operation of the semiconductor device to avoid onset of the functional bug by taking a predefined action associated with the predefined trigger condition. |
| 地址 |
Sunnyvale CA US |
