发明名称 PROJECTION SYSTEM, MIRROR AND RADIATION SOURCE FOR A LITHOGRAPHIC APPARATUS.
摘要 <p>Disclosed is a system configured to project a beam of radiation onto a target portion of a substrate within a lithographic apparatus. The system comprises a mirror (510) having an actuator (500) for positioning the mirror and/or configuring the shape of the mirror, the actuator also providing active damping to the mirror, and a controller (515a, 515b) for generating actuator control signals for control of said actuator(s). A first coordinate system is used for control of said actuator(s) when positioning said mirror and/or configuring the shape of said mirror and a second coordinate system is used for control of said actuator(s) when providing active damping to said mirror.</p>
申请公布号 NL2011945(A) 申请公布日期 2014.07.29
申请号 NL20132011945 申请日期 2013.12.12
申请人 ASML NETHERLANDS B.V. 发明人 KERKHOF MARCUS;OOSTEN ANTON;BUTLER HANS;LOOPSTRA ERIK;WIJST MARC;ZAAL KOEN
分类号 G03F7/20;H05G2/00 主分类号 G03F7/20
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