发明名称 Method of producing microstructure of nitride semiconductor and photonic crystal prepared according to the method
摘要 The method of producing a GaN-based microstructure includes a step of preparing a semiconductor structure provided with a trench formed in a main surface of the nitride semiconductor and a heat-treating mask covering a main surface of the nitride semiconductor excluding the trench, a first heat-treatment step of heat-treating the semiconductor structure under an atmosphere containing nitrogen element to form a crystallographic face of the nitride semiconductor on at least a part of a sidewall of the trench, a step of removing the heat-treating mask after the first heat-treatment step and a second heat-treatment step of heat-treating the semiconductor structure under an atmosphere containing nitrogen element to close an upper portion of the trench on the sidewall of which the crystallographic face is formed with a nitride semiconductor.
申请公布号 US8791025(B2) 申请公布日期 2014.07.29
申请号 US201013002627 申请日期 2010.07.27
申请人 Canon Kabushiki Kaisha 发明人 Kawashima Shoichi;Kawashima Takeshi;Nagatomo Yasuhiro;Hoshino Katsuyuki
分类号 H01L21/302 主分类号 H01L21/302
代理机构 Fitzpatrick, Cella, Harper and Scinto 代理人 Fitzpatrick, Cella, Harper and Scinto
主权项 1. A method of producing a microstructure of a nitride semiconductor, comprising: a step of preparing a semiconductor structure provided with at least one trench formed in a main surface of the nitride semiconductor and a heat-treating mask covering the main surface of the nitride semiconductor excluding the at least one trench; a first heat-treatment step of, after the step of preparing the semiconductor structure, heat-treating the semiconductor structure under an atmosphere containing nitrogen element to form a crystallographic face of the nitride semiconductor on at least a part of a sidewall of the at least one trench; a step of removing the heat-treating mask after the first heat-treatment step; and a second heat-treatment step of, after the step of removing the heat-treating mask, heat-treating the semiconductor structure under an atmosphere containing nitrogen element to close an upper portion of the at least one trench.
地址 Tokyo JP