发明名称 Manufacturing method of semiconductor element
摘要 A manufacturing method of a semiconductor element comprises the steps of (a) preparing a growth substrate, (b) forming a semiconductor layer on the growth substrate, (c) dividing the semiconductor layer into a plurality of elements while leaving at least a part of the semiconductor layer between each element to form a sacrificial layer around each element, (d) forming a metal layer on the semiconductor layer, (e) bonding a supporting substrate to the semiconductor layer via the metal layer, and (f) removing the growth substrate from the semiconductor layer by irradiating a laser whose area of irradiation covers each element within an outline of the sacrificial layer of each element.
申请公布号 US8790944(B2) 申请公布日期 2014.07.29
申请号 US201213423571 申请日期 2012.03.19
申请人 Stanley Electric Co., Ltd. 发明人 Akagi Takanobu
分类号 H01L21/00 主分类号 H01L21/00
代理机构 Holtz Holtz Goodman & Chick PC 代理人 Holtz Holtz Goodman & Chick PC
主权项 1. A manufacturing method of a semiconductor element, comprising: (a) preparing a growth substrate; (b) forming a semiconductor layer on the growth substrate; (c) dividing the semiconductor layer into a plurality of elements while leaving at least a part of the semiconductor layer between the elements to form a sacrificial layer around each element; (d) forming a metal layer on the semiconductor layer; (e) bonding a supporting substrate to the semiconductor layer via the metal layer; and (f) removing the growth substrate from the semiconductor layer by irradiating a laser whose area of irradiation covers each element within an outline of the sacrificial layer of each element; wherein a width of the sacrificial layer is in a range of 10 to 20 μm.
地址 Tokyo JP