发明名称 |
Manufacturing method of semiconductor element |
摘要 |
A manufacturing method of a semiconductor element comprises the steps of (a) preparing a growth substrate, (b) forming a semiconductor layer on the growth substrate, (c) dividing the semiconductor layer into a plurality of elements while leaving at least a part of the semiconductor layer between each element to form a sacrificial layer around each element, (d) forming a metal layer on the semiconductor layer, (e) bonding a supporting substrate to the semiconductor layer via the metal layer, and (f) removing the growth substrate from the semiconductor layer by irradiating a laser whose area of irradiation covers each element within an outline of the sacrificial layer of each element. |
申请公布号 |
US8790944(B2) |
申请公布日期 |
2014.07.29 |
申请号 |
US201213423571 |
申请日期 |
2012.03.19 |
申请人 |
Stanley Electric Co., Ltd. |
发明人 |
Akagi Takanobu |
分类号 |
H01L21/00 |
主分类号 |
H01L21/00 |
代理机构 |
Holtz Holtz Goodman & Chick PC |
代理人 |
Holtz Holtz Goodman & Chick PC |
主权项 |
1. A manufacturing method of a semiconductor element, comprising:
(a) preparing a growth substrate; (b) forming a semiconductor layer on the growth substrate; (c) dividing the semiconductor layer into a plurality of elements while leaving at least a part of the semiconductor layer between the elements to form a sacrificial layer around each element; (d) forming a metal layer on the semiconductor layer; (e) bonding a supporting substrate to the semiconductor layer via the metal layer; and (f) removing the growth substrate from the semiconductor layer by irradiating a laser whose area of irradiation covers each element within an outline of the sacrificial layer of each element; wherein a width of the sacrificial layer is in a range of 10 to 20 μm. |
地址 |
Tokyo JP |