发明名称 Resistance change memory device having threshold switching and memory switching characters, fabrication method for the same, and resistance change memory device array having the same
摘要 <p>Disclosed are a resistance change memory device, a method of fabricating the same, and a resistance change memory array including the same. The resistance change memory device includes a first electrode and a second electrode. A hybrid switching layer is interposed between the first electrode and the second electrode. The hybrid switching layer is a metal oxide layer having both threshold switching characteristics and memory switching characteristics.</p>
申请公布号 KR101423930(B1) 申请公布日期 2014.07.28
申请号 KR20120039566 申请日期 2012.04.17
申请人 发明人
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
代理机构 代理人
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