发明名称 |
PLASMA PROCESSING METHOD AND PLASMA PROCESSING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To improve controllability of a film thickness according to a temperature of a member.SOLUTION: A plasma processing method includes a film forming step, a plasma processing step, and a removal step. The film forming step forms a silicon oxide film on a surface of a member arranged inside a chamber by plasma of a silicon-containing gas not including oxygen while adjusting the member at a lower temperature than other members. The plasma processing step processes a workpiece carried into the chamber by plasma of a process gas after a silicon oxide film is formed on the surface of the member. The removal step removes the silicon oxide film from the surface of the member by plasma of a fluorine-containing gas after the plasma-processed workpiece is carried out of the chamber. |
申请公布号 |
JP2014138027(A) |
申请公布日期 |
2014.07.28 |
申请号 |
JP20130004698 |
申请日期 |
2013.01.15 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
KATSUNUMA TAKAYUKI;HONDA MASANOBU;ICHIKAWA HIRONORI |
分类号 |
H01L21/3065;C23C16/42;C23C16/56;H01L21/31;H05H1/46 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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