发明名称 |
PATTERN FORMING METHOD, RESIST COMPOSITION, POLYMERIC COMPOUND AND MONOMER |
摘要 |
PROBLEM TO BE SOLVED: To provide a pattern forming method for forming a negative pattern in which a high dissolution contrast is obtained in organic solvent development and an unexposed part is dissolved while an exposed part is not dissolved, and to provide a resist composition, a polymeric compound and a monomer for achieving the above method.SOLUTION: A negative pattern forming method is provided, in which the following resist composition is used: the resist composition comprises a polymeric compound including a repeating unit a1 expressed by formula (1). The polymeric compound decreases solubility to an organic solvent by forming a lactone ring with acid action. |
申请公布号 |
JP2014137473(A) |
申请公布日期 |
2014.07.28 |
申请号 |
JP20130005982 |
申请日期 |
2013.01.17 |
申请人 |
SHIN ETSU CHEM CO LTD |
发明人 |
HASEGAWA KOJI;SAGEHASHI MASAYOSHI;KATAYAMA KAZUHIRO;KOBAYASHI TOMOHIRO |
分类号 |
G03F7/038;C08F20/26;G03F7/004;G03F7/039;G03F7/32;H01L21/027 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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