发明名称 PATTERN FORMING METHOD, RESIST COMPOSITION, POLYMERIC COMPOUND AND MONOMER
摘要 PROBLEM TO BE SOLVED: To provide a pattern forming method for forming a negative pattern in which a high dissolution contrast is obtained in organic solvent development and an unexposed part is dissolved while an exposed part is not dissolved, and to provide a resist composition, a polymeric compound and a monomer for achieving the above method.SOLUTION: A negative pattern forming method is provided, in which the following resist composition is used: the resist composition comprises a polymeric compound including a repeating unit a1 expressed by formula (1). The polymeric compound decreases solubility to an organic solvent by forming a lactone ring with acid action.
申请公布号 JP2014137473(A) 申请公布日期 2014.07.28
申请号 JP20130005982 申请日期 2013.01.17
申请人 SHIN ETSU CHEM CO LTD 发明人 HASEGAWA KOJI;SAGEHASHI MASAYOSHI;KATAYAMA KAZUHIRO;KOBAYASHI TOMOHIRO
分类号 G03F7/038;C08F20/26;G03F7/004;G03F7/039;G03F7/32;H01L21/027 主分类号 G03F7/038
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