发明名称 SEMICONDUCTOR DEVICE
摘要 In order to provide a semiconductor device with high electrostatic discharge (ESD) tolerance, ground voltage wiring (22a) is electrically connected to wiring (22b) from a ground voltage pad for external connection at one end of the ground voltage wiring (22a) in the wiring direction. Input voltage wiring (23a) is electrically connected to wiring (23b) from an input voltage pad for external connection at one end of the input voltage wiring (23a) in the wiring direction. The one end of the ground voltage wiring (22a) and the one end of the input voltage wiring (23a) are centered on the center of an N-type metal-oxide-semiconductor (NMOS) transistor (10), and serve as semiconductor devices (IC) that roughly opposite each other.
申请公布号 WO2014112294(A1) 申请公布日期 2014.07.24
申请号 WO2013JP84289 申请日期 2013.12.20
申请人 SEIKO INSTRUMENTS INC. 发明人 SHIMAZAKI, KOICHI;HIROSE, YOSHITSUGU
分类号 H01L21/336;H01L21/822;H01L27/04;H01L27/06;H01L29/78 主分类号 H01L21/336
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