发明名称 TIME-OF-FLIGHT MASS SPECTROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a time-of-flight mass spectroscope capable of performing precise measurement by reliably eliminating variation in initial energy due to initial distribution of ions by easily reducing the distortion in an inclined electric field for turning back, which is caused from accumulation of manufacturing errors of the respective components constituting a reflectron in the time-of-flight mass spectroscope.SOLUTION: An insulation spacer for positioning electrodes 11 of the reflectron at constant intervals is formed in an integrated item in which electrodes are connected to each other in an axial line of a flight tube (insulation spacer structure) 12. With this, compared to conventional reflectron structures in which independent insulation spacers are provided to the respective electrodes, increase of errors caused from accumulation of component errors is prevented. Accordingly, the squareness with respect to the position of the electrode 11 and axial line of the flight tube is increased.
申请公布号 JP2014135248(A) 申请公布日期 2014.07.24
申请号 JP20130003984 申请日期 2013.01.11
申请人 SHIMADZU CORP 发明人 TANIGUCHI JUNICHI
分类号 H01J49/06;H01J49/40 主分类号 H01J49/06
代理机构 代理人
主权项
地址