发明名称 |
INSPECTION INSTRUMENT AUTO-CONFIGURATION |
摘要 |
A method includes obtaining, via an inspection instrument, identifying information relating to an object that is to be inspected; querying, via the inspection instrument, a data source for relevant inspection information using at least the identifying information; receiving, via the inspection instrument, the relevant inspection information; and configuring the inspection instrument, via changes automatically implemented by the inspection instrument, based upon the received relevant inspection information. |
申请公布号 |
US2014207403(A1) |
申请公布日期 |
2014.07.24 |
申请号 |
US201313747438 |
申请日期 |
2013.01.22 |
申请人 |
Messinger Jason Howard;Soorianarayanan Sekhar;Ward Robert Carroll;Domke Michael Christopher;Sbihli Scott Leo |
发明人 |
Messinger Jason Howard;Soorianarayanan Sekhar;Ward Robert Carroll;Domke Michael Christopher;Sbihli Scott Leo |
分类号 |
G06F17/00 |
主分类号 |
G06F17/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method, comprising:
obtaining, via an inspection instrument, identifying information relating to an object, or a particular portion thereof, that is to be inspected; querying, via the inspection instrument, a data source for relevant inspection information using at least the identifying information; receiving, via the inspection instrument, the relevant inspection information; and configuring the inspection instrument, via changes automatically implemented by the inspection instrument, based upon the received relevant inspection information. |
地址 |
Andover MA US |