发明名称 Automated Multiple Location Sampling Analysis System
摘要 An analysis system (e.g., LIBS) includes a laser source generating a laser beam, a movable optic configured to move said laser beam to multiple locations on a sample, and a spectrometer responsive to photons emitted by the sample at those locations and having an output. A controller is responsive to a trigger signal and is configured in a moving spot cycle to adjust the moveable optic, activate the laser source sequentially generating photons at multiple locations on the sample, and process the spectrometer output at each location.
申请公布号 US2014204376(A1) 申请公布日期 2014.07.24
申请号 US201313746108 申请日期 2013.01.21
申请人 SCIAPS, INC. 发明人 Day David
分类号 G01J3/443 主分类号 G01J3/443
代理机构 代理人
主权项 1. An analysis system comprising: a laser source generating a laser beam; a movable optic configured to move said laser beam to multiple locations on a sample; a spectrometer responsive to photons emitted by the sample at said locations and having an output; and a controller, responsive to a trigger signal, and configured in a moving spot cycle to: adjust the moveable optic,activate the laser source sequentially generating photons at multiple locations on the sample, andprocess the spectrometer output at each location.
地址 Woburn MA US