发明名称 |
METHOD OF PRODUCING COMPOSITE WAFER AND COMPOSITE WAFER |
摘要 |
There is provided a method that includes forming a sacrificial layer and the semiconductor crystal layer on a semiconductor crystal layer formation wafer in the stated order, bonding together the semiconductor crystal layer formation wafer and a transfer-destination wafer such that a first surface of the semiconductor crystal layer and a second surface of the transfer-destination wafer face each other, and splitting the transfer-destination wafer from the semiconductor crystal layer formation wafer with the semiconductor crystal layer remaining on the transfer-destination wafer side, by etching away the sacrificial layer by immersing the semiconductor crystal layer formation wafer and the transfer-destination wafer wholly or partially in an etchant. Here, the transfer-destination wafer includes an inflexible wafer and an organic material layer, and a surface of the organic material layer is the second surface. |
申请公布号 |
US2014203408(A1) |
申请公布日期 |
2014.07.24 |
申请号 |
US201414220669 |
申请日期 |
2014.03.20 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY ;SUMITOMO CHEMICAL COMPANY, LIMITED |
发明人 |
TAKADA Tomoyuki;YAMADA Hisashi;HATA Masahiko;MAEDA Tatsuro;ITATANI Taro;YASUDA Tetsuji |
分类号 |
H01L29/06;H01L21/306 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
1. A method for producing a composite wafer including a semiconductor crystal layer, the method comprising:
forming, in order, a sacrificial layer and the semiconductor crystal layer directly or indirectly on a semiconductor crystal layer formation wafer; bonding together the semiconductor crystal layer formation wafer and a transfer-destination wafer such that a first surface and a second surface face each other, the first surface being a surface of any layer formed directly or indirectly on the semiconductor crystal layer formation wafer, and the second surface being a surface of the transfer-destination wafer or of any layer formed directly or indirectly on the transfer-destination wafer and is to be in contact with the first surface; and splitting the transfer-destination wafer from the semiconductor crystal layer formation wafer with the semiconductor crystal layer remaining on the transfer-destination wafer side, by etching away sacrificial layer by immersing the semiconductor crystal layer formation wafer and the transfer-destination wafer wholly or partially in an etchant, and wherein the transfer-destination wafer comprises an inflexible wafer and an organic material layer, and the surface of the organic material layer is the second surface. |
地址 |
Tokyo JP |