发明名称 |
Reduced Substrate Coupling for Inductors in Semiconductor Devices |
摘要 |
The present disclosure provides reduced substrate coupling for inductors in semiconductor devices. A method of fabricating a semiconductor device having reduced substrate coupling includes providing a substrate having a first region and a second region. The method also includes forming a first gate structure over the first region and a second gate structure over the second region, wherein the first and second gate structures each include a dummy gate. The method next includes forming an inter layer dielectric (ILD) over the substrate and forming a photoresist (PR) layer over the second gate structure. Then, the method includes removing the dummy gate from the first gate structure, thereby forming a trench and forming a metal gate in the trench so that a transistor may be formed in the first region, which includes a metal gate, and an inductor component may be formed over the second region, which does not include a metal gate. |
申请公布号 |
US2014203375(A1) |
申请公布日期 |
2014.07.24 |
申请号 |
US201414250519 |
申请日期 |
2014.04.11 |
申请人 |
CHUANG HARRY HAK-LAY;ZHU MING;TEO LEE-WEE |
发明人 |
CHUANG HARRY HAK-LAY;ZHU MING;TEO LEE-WEE |
分类号 |
H01L27/06 |
主分类号 |
H01L27/06 |
代理机构 |
|
代理人 |
|
主权项 |
1. A semiconductor device comprising:
a substrate having a first region and a second region; a first gate structure formed over the first region, wherein the first gate structure includes a metal gate; a second gate structure formed over the second region, wherein the second gate structure includes a non-metal dummy gate; an inter layer dielectric (ILD) formed over the substrate; and an inductor component formed over the second region. |
地址 |
CRESCENT SG |