发明名称 Reduced Substrate Coupling for Inductors in Semiconductor Devices
摘要 The present disclosure provides reduced substrate coupling for inductors in semiconductor devices. A method of fabricating a semiconductor device having reduced substrate coupling includes providing a substrate having a first region and a second region. The method also includes forming a first gate structure over the first region and a second gate structure over the second region, wherein the first and second gate structures each include a dummy gate. The method next includes forming an inter layer dielectric (ILD) over the substrate and forming a photoresist (PR) layer over the second gate structure. Then, the method includes removing the dummy gate from the first gate structure, thereby forming a trench and forming a metal gate in the trench so that a transistor may be formed in the first region, which includes a metal gate, and an inductor component may be formed over the second region, which does not include a metal gate.
申请公布号 US2014203375(A1) 申请公布日期 2014.07.24
申请号 US201414250519 申请日期 2014.04.11
申请人 CHUANG HARRY HAK-LAY;ZHU MING;TEO LEE-WEE 发明人 CHUANG HARRY HAK-LAY;ZHU MING;TEO LEE-WEE
分类号 H01L27/06 主分类号 H01L27/06
代理机构 代理人
主权项 1. A semiconductor device comprising: a substrate having a first region and a second region; a first gate structure formed over the first region, wherein the first gate structure includes a metal gate; a second gate structure formed over the second region, wherein the second gate structure includes a non-metal dummy gate; an inter layer dielectric (ILD) formed over the substrate; and an inductor component formed over the second region.
地址 CRESCENT SG