| 摘要 |
<p>A defect inspection device (100) is provided with: a transport unit (11) that transports a sheet-like molded body; a light irradiation unit (12) that irradiates light on the sheet-like molded body; an imaging unit (13) that generates two-dimensional image data by means of an imaging operation; a boundary extraction unit (1411) that extracts boundary line parts between light and dark parts in two-dimensional images represented by the two-dimensional image data; a re-extraction unit (1412) that connects the boundary line parts extracted by the boundary extraction unit (1411) to form apparent boundary lines, smooths the apparent boundary lines in such a manner that sharp peaks appearing on the apparent boundary lines disappear, and extracts, from the two-dimensional image data, pixels constituting intrinsic boundary lines obtained by smoothing; and a synthesizing unit (1413) that generates one-dimensional image data comprising the pixels extracted by the re-extraction unit (1412), and generates inspection image data by synthesizing a plurality of one-dimensional image data obtained from a plurality of two-dimensional image data.</p> |
