发明名称 AVALANCHE PHOTODIODES AND METHODS OF FABRICATING THE SAME
摘要 Provided are an avalanche photodiode and a method of fabricating the same. The method of fabricating the avalanche photodiode includes sequentially forming a compound semiconductor absorption layer, a compound semiconductor grading layer, a charge sheet layer, a compound semiconductor amplification layer, a selective wet etch layer, and a p-type conductive layer on an n-type substrate through a metal organic chemical vapor deposition process.
申请公布号 US2014206130(A1) 申请公布日期 2014.07.24
申请号 US201414220431 申请日期 2014.03.20
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 PARK Mi-Ran;KWON O-Kyun
分类号 H01L31/107;H01L31/0216 主分类号 H01L31/107
代理机构 代理人
主权项 1. A method of fabricating an avalanche photodiode, comprising: forming a compound semiconductor absorption layer, a compound semiconductor grading layer, a charge sheet layer, a compound semiconductor amplification layer, a selective wet etch layer, and a p-type conductive layer on an n-type substrate, wherein the compound semiconductor absorption layer, the compound semiconductor grading layer, the charge sheet layer, the compound semiconductor amplification layer, the selective wet etch layer, and the p-type conductive layer are sequentially formed on the n-type substrate through a metal organic chemical vapor deposition process.
地址 Daejeon KR