发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To enable a replacement gate process without using a CMP method, and to suppress in-plane variation and defects of a foundation film and reduce the process cost.SOLUTION: A method for manufacturing a semiconductor device includes the steps of: forming a dummy gate 6 on a semiconductor substrate 1; depositing an embedding insulating film 9 on the substrate 1 and the dummy gate 6, and embedding the dummy gate 6 by the embedding insulating film 9; etching a part of the embedding insulating film 9 to form an air gap 10 to a peripheral part of the dummy gate 6; etching the dummy gate 6 exposed due to the formation of the air gap 10 to remove the dummy gate 6 and the embedding insulating film 9 on the dummy gate 6; and forming a gate electrode 13 on the substrate 1 exposed due to the removal of the dummy gate 6, via a gate insulating film 12.</p> |
申请公布号 |
JP2014135353(A) |
申请公布日期 |
2014.07.24 |
申请号 |
JP20130001850 |
申请日期 |
2013.01.09 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
ODA MINORU;KAMIMUTA YUICHI |
分类号 |
H01L29/78;H01L21/285;H01L21/336;H01L21/8238;H01L27/092;H01L27/12;H01L29/41;H01L29/423;H01L29/49;H01L29/786 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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