发明名称 EXTREMELY THIN SEMICONDUCTOR-ON-INSULATOR FIELD-EFFECT TRANSISTOR WITH AN EPITAXIAL SOURCE AND DRAIN HAVING A LOW EXTERNAL RESISTANCE
摘要 An aspect of this invention is a method for fabricating an extremely thin semiconductor-on-insulator (ETSOI) field-effect transistor (FET) having an epitaxial source and drain. The method includes providing an ETSOI substrate; forming at least one isolation structure on the ETSOI substrate; forming a gate on the ETSOI substrate; forming a spacer-on the ETSOI substrate; and using an epitaxial growth process to provide a raised source/drain structure having a non-uniform concentration of carbon along a vertical axis.
申请公布号 US2014203361(A1) 申请公布日期 2014.07.24
申请号 US201313746940 申请日期 2013.01.22
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Adam Thomas N.;Chan Kevin K.;Cheng Kangguo;Doris Bruce B.;Dube Abhishek;Guo Dechao;Khakifirooz Ali;Ramachandran Ravikumar;Reznicek Alexander
分类号 H01L29/66;H01L29/78 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method for fabricating an extremely thin semiconductor-on-insulator (ETSOI) field-effect transistor (FET) having an epitaxial source and drain, the method comprising: providing an ETSOI substrate; forming at least one isolation structure on the ETSOI substrate; forming a gate on the ETSOI substrate; forming a spacer on the ETSOI substrate; using an epitaxial growth process to provide a raised source/drain structure having a non-uniform concentration of carbon; wherein the epitaxial growth process provides a single epitaxial layer having a bottom portion, a top portion and a carbon gradient such that the bottom portion is provided with a higher concentration of carbon relative to the top portion; and forming a plurality of ohmic contacts to the top portion of the epitaxial layer.
地址 Armonk NY US