发明名称 |
EXTREMELY THIN SEMICONDUCTOR-ON-INSULATOR FIELD-EFFECT TRANSISTOR WITH AN EPITAXIAL SOURCE AND DRAIN HAVING A LOW EXTERNAL RESISTANCE |
摘要 |
An aspect of this invention is a method for fabricating an extremely thin semiconductor-on-insulator (ETSOI) field-effect transistor (FET) having an epitaxial source and drain. The method includes providing an ETSOI substrate; forming at least one isolation structure on the ETSOI substrate; forming a gate on the ETSOI substrate; forming a spacer-on the ETSOI substrate; and using an epitaxial growth process to provide a raised source/drain structure having a non-uniform concentration of carbon along a vertical axis. |
申请公布号 |
US2014203361(A1) |
申请公布日期 |
2014.07.24 |
申请号 |
US201313746940 |
申请日期 |
2013.01.22 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Adam Thomas N.;Chan Kevin K.;Cheng Kangguo;Doris Bruce B.;Dube Abhishek;Guo Dechao;Khakifirooz Ali;Ramachandran Ravikumar;Reznicek Alexander |
分类号 |
H01L29/66;H01L29/78 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating an extremely thin semiconductor-on-insulator (ETSOI) field-effect transistor (FET) having an epitaxial source and drain, the method comprising:
providing an ETSOI substrate; forming at least one isolation structure on the ETSOI substrate; forming a gate on the ETSOI substrate; forming a spacer on the ETSOI substrate; using an epitaxial growth process to provide a raised source/drain structure having a non-uniform concentration of carbon; wherein the epitaxial growth process provides a single epitaxial layer having a bottom portion, a top portion and a carbon gradient such that the bottom portion is provided with a higher concentration of carbon relative to the top portion; and forming a plurality of ohmic contacts to the top portion of the epitaxial layer. |
地址 |
Armonk NY US |