发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
In order to provide a semiconductor device with high electrostatic discharge (ESD) resistance, each of a plurality of source wires (22) is constituted by a metal film of the same shape; each of a plurality of sources (12) is electrically connected to a ground voltage wire (22a); each of a plurality of drain wires (23) is constituted by a metal film of the same shape; each of a plurality of drains (13) is electrically connected to an input voltage wire (23a); each of a plurality of gate wires (21) is constituted by a metal film of the same shape; and each of a plurality of gates (11) is electrically connected to the ground voltage wire (22a). In addition, a back gate wire (24) is constituted by a metal film; a back gate (14) is electrically to the ground voltage wire (22a); and the back gate wire (24) is separate from the source wires (22) on the sources (12). |
申请公布号 |
WO2014112293(A1) |
申请公布日期 |
2014.07.24 |
申请号 |
WO2013JP84288 |
申请日期 |
2013.12.20 |
申请人 |
SEIKO INSTRUMENTS INC. |
发明人 |
SHIMAZAKI, KOICHI;HIROSE, YOSHITSUGU |
分类号 |
H01L21/336;H01L21/822;H01L21/8234;H01L27/04;H01L27/06;H01L27/088;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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