发明名称 SEMICONDUCTOR DEVICE
摘要 In order to provide a semiconductor device with high electrostatic discharge (ESD) resistance, each of a plurality of source wires (22) is constituted by a metal film of the same shape; each of a plurality of sources (12) is electrically connected to a ground voltage wire (22a); each of a plurality of drain wires (23) is constituted by a metal film of the same shape; each of a plurality of drains (13) is electrically connected to an input voltage wire (23a); each of a plurality of gate wires (21) is constituted by a metal film of the same shape; and each of a plurality of gates (11) is electrically connected to the ground voltage wire (22a). In addition, a back gate wire (24) is constituted by a metal film; a back gate (14) is electrically to the ground voltage wire (22a); and the back gate wire (24) is separate from the source wires (22) on the sources (12).
申请公布号 WO2014112293(A1) 申请公布日期 2014.07.24
申请号 WO2013JP84288 申请日期 2013.12.20
申请人 SEIKO INSTRUMENTS INC. 发明人 SHIMAZAKI, KOICHI;HIROSE, YOSHITSUGU
分类号 H01L21/336;H01L21/822;H01L21/8234;H01L27/04;H01L27/06;H01L27/088;H01L29/78 主分类号 H01L21/336
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