发明名称 SIGNAL TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a signal test device.SOLUTION: A signal test device includes: a probe body; a probe column installed at one end of the probe body; a probe pin connected to the probe column and contacted with a signal end of a test object; a ground terminal connected to the probe body and contacted with a ground end of the test object; and a cable installed at the other end of the probe body and connected to an oscilloscope. One end of the probe pin is movably installed in the inside of the probe column, and in the inside of the probe column, a propulsion sheet connected to the probe pin through a first switch and a first interlocking rod electrically connected to a waveform capturing button of the oscilloscope is installed. When receiving pressing force, the probe pin moves toward the inside of the probe column. The interlocking rod and the propulsion sheet move toward the first switch with the probe pin to propel the first switch, thereby touching off the wave form capturing button of the oscilloscope to capture the wave forms of a test signal.
申请公布号 JP2014134538(A) 申请公布日期 2014.07.24
申请号 JP20130257972 申请日期 2013.12.13
申请人 KOFUKIN SEIMITSU KOGYO (SHENZHEN) YUGENKOSHI;HON HAI PRECISION INDUSTRY CO LTD 发明人 MA SONG;WU ZHOU
分类号 G01R13/20;G01R1/067 主分类号 G01R13/20
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