发明名称 |
STAGE TRANSFERRING DEVICE AND POSITION MEASURING METHOD THEREOF |
摘要 |
A stage transferring device invention includes: a transferring stage upon which an object is mounted and which transfers the object in an x-y plane; and a stage position measuring device. The stage position measuring device includes a one-dimensional scale on the transferring stage; a one-dimensional scale reading head which is configured to overlap the one-dimensional scale, irradiate a measuring beam to the overlapped one-dimensional scale and measure a 1D y-axis coordinate of the transferring stage; a two-dimensional encoder on the transferring stage; and a two-dimensional encoder reading head which is configured to overlap the two-dimensional encoder, irradiate a measuring beam to the overlapped two-dimensional encoder and measure a 2D x-axis coordinate and a 2D y-axis coordinate of the transferring stage. |
申请公布号 |
US2014204392(A1) |
申请公布日期 |
2014.07.24 |
申请号 |
US201313959864 |
申请日期 |
2013.08.06 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
LEE Hi Kuk;JANG Sang Don;CHANG Jae Hyuk;KONG Hyang-Shik;KIM Cha-Dong;KIM Chang Hoon;PARK Jung-In;YUN Sang Hyun |
分类号 |
G01B11/14 |
主分类号 |
G01B11/14 |
代理机构 |
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代理人 |
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主权项 |
1. A stage transferring device comprising:
a transferring stage upon which an object is mounted and which transfers the object in an x-y plane; and a stage position measuring device comprising:
a one-dimensional scale on the transferring stage;a one-dimensional scale reading head which is configured to overlap the one-dimensional scale, irradiate a measuring beam to the overlapped one-dimensional scale and measure a 1D y-axis coordinate of the transferring stage;a two-dimensional encoder on the transferring stage; anda two-dimensional encoder reading head which is configured to overlap the two-dimensional encoder, irradiate a measuring beam to the overlapped two-dimensional encoder and measure a 2D x-axis coordinate and a 2D y-axis coordinate of the transferring stage. |
地址 |
Yongin-City KR |