SUB-LUN INPUT/OUTPUT PROFILING FOR SSD DEVICES

摘要

A read/write ratio for each of a plurality of data segments classified in a hot category as hot data segments is determined. Each of the plurality of hot data segments is ordered by the read/write ratio in a descending order. Each of a plurality of available SSD devices is ordered by a remaining life expectancy in an ascending order. Those of the plurality of hot data segments are matched with those of the plurality of hot data segments with those of the plurality of available SSD devices such that a hot data segment having a higher read/write ratio is provided to an SSD device having a smaller remaining life expectancy than another hot data segment having a lower read/write ratio.

主权项

1. A method for profiling input/output (I/O) for solid state drive (SSD) devices in a computing storage environment including a storage device hierarchy by a processor device, comprising:
determining a read-to-write ratio for each of a plurality of data segments; if the read-to-write ratio for a data segment is less than a predefined threshold, maintaining the data segment in a storage device in a lower level of the storage device hierarchy than the SSD devices; if the read-to-write ratio for the data segment is greater than the predefined threshold, adding the data segment to a ratio list; ordering each data segment on the ratio list by the read-to-write ratio in descending order; ordering each of a plurality of available SSD devices by a remaining life expectancy in ascending order; matching those data segments on the ratio list with those of the plurality of available SSD devices such that each data segment on the ratio list including a higher read-to-write ratio is matched to an SSD device including a smaller remaining life expectancy than another data segment on the ratio list including a lower read-to-write ratio; and storing each data segment on the ratio list with each respective matched available SSD device.