发明名称 STRAIN INDUCED REDUCTION OF SWITCHING CURRENT IN SPIN-TRANSFER TORQUE SWITCHING DEVICES
摘要 Partial perpendicular magnetic anisotropy (PPMA) type magnetic random access memory cells are constructed using processes and structural configurations that induce a directed static strain/stress on an MTJ to increase the perpendicular magnetic anisotropy. Consequently, reduced switching current of the MTJ results. The directed static strain/stress on the MTJ is induced in a controlled direction and/or with a controlled magnitude during fabrication. The MTJ is permanently subject to a predetermined directed stress and permanently includes the directed static strain/strain that provides reduced switching current.
申请公布号 US2014206104(A1) 申请公布日期 2014.07.24
申请号 US201414219026 申请日期 2014.03.19
申请人 QUALCOMM Incorporated 发明人 Zhu Xiaochun;Li Xia;Chen Wei-Chuan;Kang Seung Hyuk
分类号 H01L43/12 主分类号 H01L43/12
代理机构 代理人
主权项 1. A method of fabricating a magnetic tunnel junction (MTJ) device with reduced switching current, the method comprising: depositing an MTJ film; patterning the MTJ film to form an MTJ; depositing a stress-strain film against the MTJ; patterning the stress-strain film in a pattern that induces a directed static strain and/or stress in the MTJ; and patterning an oxide spacer between the MTJ and the stress-strain film, the oxide spacer having an angled surface configured to apply a desired direction of the directed static strain and/or stress.
地址 San Diego CA US