发明名称 |
STRAIN INDUCED REDUCTION OF SWITCHING CURRENT IN SPIN-TRANSFER TORQUE SWITCHING DEVICES |
摘要 |
Partial perpendicular magnetic anisotropy (PPMA) type magnetic random access memory cells are constructed using processes and structural configurations that induce a directed static strain/stress on an MTJ to increase the perpendicular magnetic anisotropy. Consequently, reduced switching current of the MTJ results. The directed static strain/stress on the MTJ is induced in a controlled direction and/or with a controlled magnitude during fabrication. The MTJ is permanently subject to a predetermined directed stress and permanently includes the directed static strain/strain that provides reduced switching current. |
申请公布号 |
US2014206104(A1) |
申请公布日期 |
2014.07.24 |
申请号 |
US201414219026 |
申请日期 |
2014.03.19 |
申请人 |
QUALCOMM Incorporated |
发明人 |
Zhu Xiaochun;Li Xia;Chen Wei-Chuan;Kang Seung Hyuk |
分类号 |
H01L43/12 |
主分类号 |
H01L43/12 |
代理机构 |
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代理人 |
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主权项 |
1. A method of fabricating a magnetic tunnel junction (MTJ) device with reduced switching current, the method comprising:
depositing an MTJ film; patterning the MTJ film to form an MTJ; depositing a stress-strain film against the MTJ; patterning the stress-strain film in a pattern that induces a directed static strain and/or stress in the MTJ; and patterning an oxide spacer between the MTJ and the stress-strain film, the oxide spacer having an angled surface configured to apply a desired direction of the directed static strain and/or stress. |
地址 |
San Diego CA US |