发明名称 PHOTOMASK AND PATTERN FORMING METHOD USING SAME
摘要 A photomask includes a transparent substrate and a light-shielding section provided on the transparent substrate. The light-shielding section has a translucent mask pattern opening, and in the mask pattern opening, there are provided a plurality of translucent areas that transmit light to peripheries of areas corresponding to a desired pattern, in at least three different phases with respect to exposure light. In order that exposure light having passed through the mask pattern opening should form a projected image in a desired pattern on an exposed body positioned at a predetermined distance, the translucent areas are configured as follows: a phase plane of the exposure light that has passed through a translucent area far from the areas corresponding to the desired pattern, among the translucent areas, progresses with respect to the exposed body, as compared with a phase plane of exposure light that has passed through a translucent area close to the areas corresponding to the desired pattern.
申请公布号 WO2014111983(A1) 申请公布日期 2014.07.24
申请号 WO2013JP05834 申请日期 2013.10.01
申请人 PANASONIC CORPORATION 发明人 MISAKA, AKIO
分类号 G03F1/28;G03F1/70;G03F7/20;H01L21/027 主分类号 G03F1/28
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