| 摘要 |
<p>In an example embodiment, a scannable storage element (200) includes an input circuit (260) for providing a first signal at first node (278) based on a data input (D) and a scan input (SD), where the scan input may be of pull-up logic in functional mode. The input circuit (260) includes a first pull-up path (262, 264) comprising a switch (262) receiving data input (D) and a switch (264) receiving scan enable input (SCAN), a second pull-up path (266, 268) comprising a switch (266) receiving scan input (SD), a first pull-down path (270, 272) comprising a switch (270) receiving the scan enable input (SCAN) and a switch (272) receiving the scan input (SD), and second pull-down path (274, 276) comprising a switch (276) receiving the data input (D). The storage element (200) includes a shifting circuit (150) configured to provide a second signal at a second node (145) in response to the first signal, and a scan output buffer (320) coupled to the second node (145) and configured to provide a scan output (SQ) at a scan output terminal (310) in response to the second signal.</p> |
