发明名称 System and Device for Non-Destructive Raman Analysis
摘要 A Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.
申请公布号 US2014204373(A1) 申请公布日期 2014.07.24
申请号 US201414221418 申请日期 2014.03.21
申请人 Hologic, Inc. 发明人 Mazzio Victor
分类号 G01J3/02;G01J3/44 主分类号 G01J3/02
代理机构 代理人
主权项 1. A Raman microspectrometer system for non-destructive analysis of an oversized sample that includes amorphous selenium comprising: a Raman microspectrometer comprising an optical microscope coupled to a spectrometer by an optical transfer tube, the optical microscope comprising a lens and a stage; and an optical extender removably coupled to the optical microscope and having a proximal orifice aligned with the lens and a distal orifice, the optical extender for extending an optical reach of the microscope to the distal orifice, wherein a sensitivity of the Raman microspectrometer to some molecular vibrations corresponding to crystallized selenium is increased with the optical reach of the microscope extended and decreased with the optical reach of the microscope not extended.
地址 Bedford MA US