发明名称 AUTOMATED MULTIPLE LOCATION SAMPLING ANALYSIS SYSTEM
摘要 <p>An analysis system (e.g., LIBS) includes a laser source generating a laser beam, a movable optic configured to move said laser beam to multiple locations on a sample, and a spectrometer responsive to photons emitted by the sample at those locations and having an output. A controller is responsive to a trigger signal and is configured in a moving spot cycle to adjust the moveable optic, activate the laser source sequentially generating photons at multiple locations on the sample, and process the spectrometer output at each location.</p>
申请公布号 WO2014113680(A2) 申请公布日期 2014.07.24
申请号 WO2014US12060 申请日期 2014.01.17
申请人 SCIAPS, INC. 发明人 DAY, DAVID
分类号 G01J3/443 主分类号 G01J3/443
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