| 发明名称 |
SCALABLE TEST PLATFORM |
| 摘要 |
A scalable test platform includes a PCIe-based event fabric. One or more instrument subsystems are coupled to the PCIe-based event fabric and configured to interface one or more devices under test and generate captured test data. One or more digital signal processing subsystems are coupled to the PCIe-based event fabric and configured to process the captured test data |
| 申请公布号 |
US2014208164(A1) |
申请公布日期 |
2014.07.24 |
| 申请号 |
US201313749308 |
申请日期 |
2013.01.24 |
| 申请人 |
LTX-Credence Corporation |
发明人 |
Fritzsche William A.;Currin Jeffery D.;Poffenberger Russell Elliott;Alton Timothy;Davis Michael Gordon |
| 分类号 |
G06F11/26 |
主分类号 |
G06F11/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A scalable test platform comprising:
a PCIe-based event fabric; one or more instrument subsystems coupled to the PCIe-based event fabric and configured to interface one or more devices under test and generate captured test data; and one or more digital signal processing subsystems coupled to the PCIe-based event fabric and configured to process the captured test data. |
| 地址 |
Norwood MA US |
