发明名称 MAGNETIC FIELD MEASUREMENT APPARATUS
摘要 A magnetic field measurement apparatus includes a probe beam irradiating unit that radiates a probe beam. A gas cell is arranged on an optical axis of the probe beam and shows a linear dichroism with respect to the probe beam between a first axis and a second axis. Another gas cell is arranged on the optical axis of the probe beam on the opposite side of the probe beam irradiating unit with respect to the gas cell, and shows a linear dichroism with respect to the probe beam between a third axis and a fourth axis, which are different from the first and the second axes. A measuring unit measures a difference between magnetic fields in the gas cells and on the basis of amounts of change of a plane of polarization of the probe beam that has passed through the gas cell and the gas cell.
申请公布号 US2014206981(A1) 申请公布日期 2014.07.24
申请号 US201414159925 申请日期 2014.04.02
申请人 SEIKO EPSON CORPORATION 发明人 NAGASAKA Kimio
分类号 A61B5/04 主分类号 A61B5/04
代理机构 代理人
主权项 1. A magnetic field measurement apparatus comprising: a probe beam irradiating unit configured to radiate a probe beam; a first medium arranged on an optical axis of the probe beam and showing a linear dichroism with respect to the probe beam between a first axis and a second axis; a second medium arranged on the optical axis of the probe beam on the opposite side of the irradiating unit with respect to the first medium, and showing a linear dichroism with respect to the probe beam between a third axis and a fourth axis, which are different from the first axis and the second axis; and a measuring unit configured to measure a difference between a magnetic field in the first medium and a magnetic field in the second medium on the basis of amounts of change of a plane of polarization of the probe beam that has passed through the first medium and the second medium.
地址 Tokyo JP