| 发明名称 |
LAYOUT STRUCTURE OF ELECTRONIC ELEMENT AND TESTING METHOD OF THE SAME THEREOF |
| 摘要 |
A layout structure of an electronic element comprising an electronic matrix, a first load and a second load is disclosed. The first load couples to a first end of the electronic matrix and comprises a first testing pad and a second testing pad coupling to the first testing pad. The second load couples to a second end of the electronic matrix and comprises a third testing pad and a fourth testing pad coupling to the third testing pad. |
| 申请公布号 |
US2014203828(A1) |
申请公布日期 |
2014.07.24 |
| 申请号 |
US201313744498 |
申请日期 |
2013.01.18 |
| 申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Chang Chun-Ming;Hou Chun-Liang;Liao Wen-Jung |
| 分类号 |
G01R31/26;H01L23/48 |
主分类号 |
G01R31/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A layout structure of the electronic element, comprising:
an electronic element matrix; a first load coupling to a first side of the electronic element matrix, the first load comprising a first testing pad and a second testing pad coupling to the first testing pad; and a second load coupling to a second side of the electronic element matrix, the second load comprising a third testing pad and a fourth testing pad coupling to the third testing pad. |
| 地址 |
Hsinchu TW |
