发明名称 |
ON-DIE ALL-DIGITAL DELAY MEASUREMENT CIRCUIT |
摘要 |
An all-digital delay measurement circuit (DMC) constructed on an integrated circuit (IC) die characterizes clocking circuits such as full phase rotation interpolators, also constructed on the IC die. The on-die all-digital DMC produces a digital output value proportional to the relative delay between two clocks, normalized to the clock period of the two clocks. |
申请公布号 |
US2014203798(A1) |
申请公布日期 |
2014.07.24 |
申请号 |
US201213997604 |
申请日期 |
2012.03.30 |
申请人 |
O'Mahony Frank;Casper Bryan K.;Mansuri Mozhgan |
发明人 |
O'Mahony Frank;Casper Bryan K.;Mansuri Mozhgan |
分类号 |
G01R31/317 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
Portland OR US |