发明名称 ON-DIE ALL-DIGITAL DELAY MEASUREMENT CIRCUIT
摘要 An all-digital delay measurement circuit (DMC) constructed on an integrated circuit (IC) die characterizes clocking circuits such as full phase rotation interpolators, also constructed on the IC die. The on-die all-digital DMC produces a digital output value proportional to the relative delay between two clocks, normalized to the clock period of the two clocks.
申请公布号 US2014203798(A1) 申请公布日期 2014.07.24
申请号 US201213997604 申请日期 2012.03.30
申请人 O'Mahony Frank;Casper Bryan K.;Mansuri Mozhgan 发明人 O'Mahony Frank;Casper Bryan K.;Mansuri Mozhgan
分类号 G01R31/317 主分类号 G01R31/317
代理机构 代理人
主权项
地址 Portland OR US