发明名称
摘要 PROBLEM TO BE SOLVED: To provide a cubic crystal silicon carbide semiconductor substrate on which a high-quality epitaxial film with few crystal defects is formed. SOLUTION: The cubic crystal silicon carbide semiconductor substrate includes a silicon substrate 11 and a cubic crystal silicon carbide epitaxial film 12 formed by epitaxially growing cubic crystal silicon carbide on the silicon substrate 11. The cubic crystal silicon carbide epitaxial film 12 is formed on a first plane 11a to be a crystal plane expressed by Miller index (100) on the silicon substrate 11 in a state that a second axis L2 expressed by Miller index [100] in the cubic crystal silicon carbide epitaxial film 12 is inclined from a first axis L1 expressed by Miller index [100] on the silicon substrate 11 by a predetermined angleΘin a first direction expressed by Miller index [011] on the silicon substrate 11. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP5556112(B2) 申请公布日期 2014.07.23
申请号 JP20090230372 申请日期 2009.10.02
申请人 发明人
分类号 H01L21/205;C23C16/42;C30B1/10;C30B29/36 主分类号 H01L21/205
代理机构 代理人
主权项
地址