发明名称 Programming inhibit method of nonvolatile memory apparatus for reducing leakage current
摘要 The invention provides a nonvolatile memory apparatus. The nonvolatile memory apparatus comprises a plurality of memory cells and a signal generator. The memory cells are arranged in an array, and each of the memory cells has a control gate terminal, a floating gate, a source line terminal, a bit-line terminal, a selected gate terminal and a word-line terminal. The signal generator is coupled to the memory cells. When the nonvolatile memory apparatus executes a programming operation, the signal generator provides a programming signal to the control gate terminals of a plurality of inhibited memory cells among the memory cells. Wherein, the programming signal is a pulse signal with a direct-current (DC) offset voltage.
申请公布号 US8787092(B2) 申请公布日期 2014.07.22
申请号 US201213418352 申请日期 2012.03.13
申请人 eMemory Technology Inc. 发明人 Chen Wei-Ren;Hsu Te-Hsun;Chen Hsin-Ming
分类号 G11C16/04;G11C16/10 主分类号 G11C16/04
代理机构 Jianq Chyun IP Office 代理人 Jianq Chyun IP Office
主权项 1. A nonvolatile memory apparatus, comprising: a plurality of memory cells, the plurality of memory cells are arranged in an array, each of the memory cells has a control gate terminal, a floating gate, a source line terminal, a bit-line terminal, a selected gate terminal and a word-line terminal, wherein each of the memory cells is configured as a structure of three transistors and one capacitor (3T1C), and the floating gate is a single-poly gate; and a signal generator, coupled to the memory cells, when the nonvolatile memory apparatus executing a programming operating, the signal generator providing a programming signal to the control gate terminals of the memory cells, wherein, the programming signal is a pulse signal with a direct-current (DC) offset voltage, when the nonvolatile memory apparatus executing the programming process, the signal generator further providing a first and a second bit-line signals to the bit-line terminals of the inhibited and non-inhibited memory cells respectively, wherein, the voltage level of the first bit-line signal is larger than the second bit-line signal.
地址 Hsinchu TW