发明名称 |
Methods and apparatus for soft demapping and intercell interference mitigation in flash memories |
摘要 |
Methods and apparatus are provided for soft demapping and intercell interference mitigation in flash memories. In one variation, a target cell in a flash memory device capable of storing at least two data levels, s, per cell is read by obtaining a measured read value, r, for at least one target cell in the flash memory; obtaining a value, h, representing data stored for at least one aggressor cell in the flash memory; selecting one or more probability density functions based on a pattern of values stored in at least a portion of the flash memory, wherein the probability density functions comprises pattern-dependent disturbance of one or more aggressor cells on the at least one target cell in the flash memory; evaluating at least one selected probability density function based on the measured read value, r; and computing one or more log likelihood ratios based on a result of the evaluating step. |
申请公布号 |
US8788923(B2) |
申请公布日期 |
2014.07.22 |
申请号 |
US200913001317 |
申请日期 |
2009.06.30 |
申请人 |
LSI Corporation |
发明人 |
Haratsch Erich F.;Ivkovic Milos;Krachkovsky Victor;Miladinovic Nenad;Vityaev Andrei;Yen Johnson |
分类号 |
G06F11/00;H03M13/00;G11C16/34;G11C5/00;G06F11/10 |
主分类号 |
G06F11/00 |
代理机构 |
Ryan, Mason & Lewis, LLP |
代理人 |
Ryan, Mason & Lewis, LLP |
主权项 |
1. A method for reading a target cell in a flash memory device capable of storing at least two data levels, s, per cell, said method comprising:
obtaining a measured read value, r, for at least one target cell in said flash memory; evaluating at least one probability density function based on said measured read value, r, wherein said probability density function indicates a probability of measuring a read value, r, for a given data level, s; and computing one or more log likelihood ratios based on a result of said evaluating step; wherein said computing step further comprises the step of: aggregating for each of two possible binary values said probability of measuring a read value, r, for a given data level, s, for multiple data levels associated with said two possible binary values. |
地址 |
San Jose CA US |