发明名称 Systems and methods for analyzing a sample
摘要 The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides systems for analyzing a sample that include an electric source, a vacuum chamber including a conducting member, in which the conducting member is coupled to the electric source, a sample introduction member coupled to the vacuum chamber, and a mass analyzer. The system is configured such that a distal end of the sample introduction member resides within the vacuum chamber and proximate the conducting member, such that an electrical discharge may be produced between the sample introduction member and the conducting member. A neutral gas that has been introduced into the vacuum chamber interacts with the generated discharge, producing ions within the vacuum chamber that are subsequently transferred into the mass analyzer in the vacuum chamber.
申请公布号 US8785846(B2) 申请公布日期 2014.07.22
申请号 US201314058856 申请日期 2013.10.21
申请人 Purdue Research Foundation 发明人 Ouyang Zheng;Tsung-Chi Chen
分类号 H01J49/10;H01J49/04;H01J49/02;H01J49/26 主分类号 H01J49/10
代理机构 Brown Rudnick LLP 代理人 Brown Rudnick LLP ;Meyers Thomas C.;Schoen Adam M.
主权项 1. A sample analysis system, the system comprising: a discontinuous sample introduction interface; an ionization mechanism comprising a tube and an electrode; and a mass analyzer located in a vacuum chamber that is separate and distinct from and operably associated with the ionization mechanism, wherein the ionization mechanism is positioned inside the vacuum chamber between the discontinuous sample introduction interface and the mass analyzer to interact with a sample gas after it has passed through the discontinuous sample introduction interface and produce ions of the sample gas that are received by the mass analyzer from the separate and distinct ionization mechanism.
地址 West Lafayette IN US