发明名称 METHODS FOR FORMING FINS FOR METAL OXIDE SEMICONDUCTOR DEVICE STRUCTURES
摘要 Methods are disclosed for forming fins in transistors. In one embodiment, a method of fabricating a device includes forming silicon fins on a substrate and forming a dielectric layer on the substrate and adjacent to the silicon fins such that an upper region of each silicon fin is exposed. Germanium may then be epitaxially grown germanium on the upper regions of the silicon fins to form germanium fins.
申请公布号 KR20140091754(A) 申请公布日期 2014.07.22
申请号 KR20147016362 申请日期 2011.12.21
申请人 INTEL CORP. 发明人 GILES MARTIN D.;GHANI TAHIR
分类号 H01L21/336;H01L21/8238;H01L29/78 主分类号 H01L21/336
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