发明名称 Semiconductor device
摘要 It is an object of the present invention to connect a wiring, an electrode, or the like formed with two incompatible films (an ITO film and an aluminum film) without increasing the cross-sectional area of the wiring and to achieve lower power consumption even when the screen size becomes larger. The present invention provides a two-layer structure including an upper layer and a lower layer having a larger width than the upper layer. A first conductive layer is formed with Ti or Mo, and a second conductive layer is formed with aluminum (pure aluminum) having low electric resistance over the first conductive layer. A part of the lower layer projected from the end section of the upper layer is bonded with ITO.
申请公布号 US8786794(B2) 申请公布日期 2014.07.22
申请号 US201313967645 申请日期 2013.08.15
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Higaki Yoshinari;Sakakura Masayuki;Yamazaki Shunpei
分类号 G02F1/136 主分类号 G02F1/136
代理机构 Husch Blackwell LLP 代理人 Husch Blackwell LLP
主权项 1. A semiconductor device comprising: a gate electrode over a substrate; a gate insulating layer over the gate electrode; a semiconductor layer over the gate insulating layer; and a source electrode and a drain electrode, over the semiconductor layer, wherein one of the source electrode and the drain electrode is electrically connected to the semiconductor layer, and has a first electrode layer and a second electrode layer, wherein the second electrode layer is formed on the first electrode layer, wherein the first electrode layer comprises titanium, wherein the second electrode layer comprises aluminum, wherein a first width of the first electrode layer is larger than a second width of the second electrode layer, wherein an upper surface of the second electrode layer is in contact with an insulating layer, wherein the first electrode layer is in contact with a pixel electrode, wherein the semiconductor layer comprises an amorphous silicon, and wherein the pixel electrode comprises an ITO.
地址 JP