Identification of integrated circuits

摘要

Techniques are generally described for generating an identification number for an integrated circuit (IC). In some examples, methods for generating an identification for an IC may comprise selecting circuit elements of the IC, evaluating measurements of an attribute of the IC for the selected circuit elements, wherein individual measurements are associated with corresponding input vectors previously applied to the IC, solving a plurality of equations formulated based at least in part on the measurements taken of the attribute of the IC for the selected circuit elements to determine scaling factors for the selected circuit elements, and transforming the determined scaling factors for the selected circuit elements to generate an identification number of the IC. Additional variants and embodiments may also be disclosed.

主权项

1. A method to identify integrated circuits, the method comprising:
evaluating measurements of one or more attributes for one or more circuit elements of an integrated circuit, wherein the measurements are associated with corresponding input vectors applied to the integrated circuit; determining scaling factors for the selected one or more circuit elements, wherein the scaling factors reflect a relationship between nominal values for the attributes and measured values for the attributes; transforming the determined scaling factors for the selected one or more circuit elements to generate transformed scaling factors; and generating an identification number of the integrated circuit based on the transformed scaling factors.