发明名称 THERMAL CHAMBER FOR ELECTRONICS TESTS
摘要 FIELD: electricity.SUBSTANCE: thermal chamber of electronics tests includes case with process chamber, fan installed in process chamber between drain and pressure pipes, recirculation air treatment unit installed in the pressure pipe in the form of coaxially connected tapered diffuser with spiral slots on the internal surface and expanding nozzle where a drying device in the form of vessel filling with adsorbent substance is positioned. On the internal surface of expanding nozzle, spiral slots are made with counter-clockwise tangent, while tangent of spiral slots on the internal surface of tapered diffuser is clockwise. Vortexes are installed in the case and angle joints of vertical and horizontal elements of air duct, each vortex in the form of a blade with end surfaces turned by 90° against each other.EFFECT: standardised conditions of climatic tests of electronic devices by uniform supply of recirculation air to all shelves of thermal chamber, thus ensuring required reliability of electrical tests for electronics.6 dwg
申请公布号 RU2523098(C2) 申请公布日期 2014.07.20
申请号 RU20120147384 申请日期 2012.11.07
申请人 FEDERAL'NOE GOSUDARSTVENNOE BJUDZHETNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA "JUGO-ZAPADNYJ GOSUDARSTVENNYJ UNIVERSITET" (JUZGU) 发明人 BOBYLEV STANISLAV IGOREVICH;KOBELEV NIKOLAJ SERGEEVICH;EMEL'JANOV SERGEJ GENNAD'EVICH;ALJAB'EVA TAT'JANA VASIL'EVNA;FEDOROV SERGEJ SERGEEVICH;KOBELEV VLADIMIR NIKOLAEVICH
分类号 H01L21/66 主分类号 H01L21/66
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