发明名称 BESSEL BEAM PLANE ILLUMINATION MICROSCOPE
摘要 A microscope has a light source for generating a light beam having a wavelength, λ, and beam-forming optics configured for receiving the light beam and generating a Bessel-like beam that is directed into a sample. The beam-forming optics include an excitation objective having an axis oriented in a first direction. Imaging optics are configured for receiving light from a position within the sample that is illuminated by the Bessel-like beam and for imaging the received light on a detector. The imaging optics include a detection objective having an axis oriented in a second direction that is non-parallel to the first direction. A detector is configured for detecting signal light received by the imaging optics, and an aperture mask is positioned
申请公布号 US2014198200(A1) 申请公布日期 2014.07.17
申请号 US201414215976 申请日期 2014.03.17
申请人 Betzig Robert E. 发明人 Betzig Robert E.
分类号 G02B21/06;G02B21/36 主分类号 G02B21/06
代理机构 代理人
主权项 1. A microscope comprising: a light source for generating a light beam having a wavelength, X; beam-forming optics, including an optical element positioned in a path of the light beam and configured for generating an annular ring of light, the beam-forming optics being configured for generating from the light beam an excitation beam having a central lobe and at least one side lobe and also configured to direct the excitation beam to a position within a sample, wherein the beam-forming optics include an excitation objective having an axis oriented in a first direction, and wherein a transverse profile of the excitation beam in the sample is intermediate between a profile of a lowest order Bessel function and the Gaussian function; imaging optics configured for receiving light from a position within the sample that is illuminated by the excitation beam and for imaging the received light on a detector, the imaging optics including a detection objective having an axis oriented in a second direction that is non-parallel to the first direction; and a detector configured for detecting light received by the imaging optics.
地址 Leesburg VA US